Interactive wafer map visualization and yield analysis for semiconductor test data. Rendering, spatial statistics, failure clustering, lot-level trends, and reticle analysis — pure ES modules, no dependencies.
react javascript typescript canvas vue svelte data-visualization spatial-analysis ate esm semiconductor stdf prober wafermap reticle wafer-map bin-map yield-analysis die-map failure-clustering
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Updated
Oct 25, 2026 - TypeScript